Hitachi UH4150 give excellent spectrum for full range of UV – NIR. Scientists are working with UH4150 for glass, lens coating research and determine the thin layer thickness. Liquid, solid and thin film deposition can be measured

FS5 Spectrofluorometer

Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS. The highest performance parameter analyzer, it delivers synchronizing current-voltage (I-V), capacitance-voltage (C-V) and ultra-fast pulsed I-V measurements.

Radiation dosimetry badge with optically stimulated luminescence (OSL) technology for monitoring photon – X-ray, beta, gamma- and the CR-39 for neutron detection radiation fields. InLight dosimeters are engineered to be read out by an InLight Reader. Designed for clients with extensive data management capabilities who prefer to independently maintain data and issue dose reports. Or opt for radiation monitoring services dose record keeping. For: Industrial, Emergency response, Research settings

Thin film coating process in a medium vacuum chamber controlled by process parameters of pressure, temperature and catalyst gas flow rate. It’s used to fabricate electrodes for semiconductor devices’ electrode and biophysics devices.

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